Publications

Z. Insepov, V. Ivanov, S. J. Jopkela, I. Veryovkin, A. Zinovev, and H. Frisch, "Comparison of Secondary Electron Emission Simulation to Experiment," Preprint ANL/MCS-P1793-1010, October 2010. [pdf]

The secondary electron emission (SEE) yields were calculated for various materials and a good comparison has been obtained with the experimental data for gold measured at ANL. The calculation method uses Monte Carlo simulation, empirical theories, and close comparison to experiment, in order to parameterize the SEE yields of highly emissive materials for microchannel plates. The simulation results will be used in the selection of emissive and resistive materials for the deposition and characterization experiments that will be conducted by a large-area fast detector project at Argonne National Laboratory